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Journal of Electron Microscopy 48(4): 437-441 (1999)
© 1999 Oxford University Press

Measurement of and compensation for the difference between voltage and current centres in HRTEM

Sakumi Moriguchi*, Seiji Isoda and Takashi Kobayashi

Institute for Chemical Research, Kyoto University Uji, Kyoto 611-0011, Japan

*To whom correspondence should be addressed. E-mail: smo{at}eels.kuicr.kyoto-u.ac.jp

Either a voltage or a current centre is used to find the axis of a transmission electron microscope so that a lens axis adjustment can be performed. The two centres are not strictly coincident with each other, although the coincidence of them is desirable. Therefore, in practice, either centre can be used. The voltage centre is usually adopted for adjusting the lens axis. The distance between the voltage and current centres of a high-resolution transmission electron microscope has been measured in this study. We propose a method for compensating for the difference between the voltage and current centres which permits both centres to be set simultaneously to the optical axis.

Keywords     voltage centre, current centre, lens axis, optical axis, lens alignment, HRTEM

Received     30 September 1998, accepted 18 March 1999


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