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Journal of Electron Microscopy 48(4): 317-321 (1999)
© 1999 Oxford University Press

High-resolution in-situ transmission electron microscopy observation of a solid-liquid interface in the Al-Si system

S. Arai1, S. Tsukimoto2, H. Miyai3 and H. Saka2

1Center for Integrated Research in Science and Engineering, Nagoya University Nagoya 464-8603, Japan
2Department of Quantum Engineering, Nagoya University Nagoya 464-8603, Japan
3Department of Materials Science and Engineering, Nagoya University Nagoya 464-8603, Japan

A solid-liquid interface in the Al-Si system has been observed at near-atomic resolution by in-situ heating experiments inside transmission electron microscopes. The solid Si/alloy liquid of Al(-Si) interface shows facetting on {111} planes of Si and is very straight on the atomic scale even while it moves during solidification. There exists a transition layer between solid Si and liquid Al(-Si).

Keywords     solid-liquid interface, HREM in-situ electron microscopy, Al-Si alloy

Received     27 November 1998, accepted 22 February 1999


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